Program


Download the Program (25/02/2015 version)


Monday June 22 Tuesday June 23 Wednesday June 24 Thursday June 25 Friday June 26
08h00 - 08h30 Introduction
8h30 - 9h30
Trevor Martin : Commercial aspects of III-V
8h00-9h30
M.Nemoz: Structural characterization I
8h00-9h30
Y. Cordier: Compounds, transport
8h00-9h30
B.Gil and B. Gayral Optical properties
8h00-9h30
Matthias auf der Maur : Modelisation
9h45-11h15
Guy Feuillet : General presentation of compound semiconductors versus GaN
9h45-11h15
C.Bougerol: Structural characterization II
9h45-11h15
M. Uren : Electronic characterization
9h45-11h15
B. Gil and B. Gayral : Optical properties
9h45-11h15
Matthias auf der Maur : Modelisation
11h30-12h15
Questions and discussions
11h30-12h15
Questions and discussions
11h30-12h15
Questions and discussions
11h30-12h15
Questions and discussions
11h30-12h15
Questions and discussions
LUNCH and SPARE TIME
16h00-17h30
N.Grandjean: Growth
16h00-17h30
J.Christen :Cathodoluminescence
16h00-17h30
B.Corbett : Devices, fabrication
16h00-17h30
Taylor: Nanophotonics

17h45-19h15
N.Grandjean: Growth
17h45-19h15
Rob Martin : Multimode SEM techniques
17h45-19h15
J.C.De Jaeger: Micro-wave power devices and circuits

17h45-19h15

Student presentations (to be explained later)



DINER
Evening session: Questions and discussions Evening session: Questions and discussions Evening session: Questions and discussions Best presentation award

Lectures (in english):

Wide perspective (2.5h)
  • Trevor Martin (UK) : Commercial aspects of III-V (1h)
  • Guy Feuillet (LETI-France) : General presentation of compound semiconductors versus GaN(1.5h)
Growth (3h)
  • N. Grandjean (EPFL, Lausanne-Switzerland): Growth (3h)
Characterization ( 6h)
  • M. Nemoz (CRHEA, France): Structural characterization I (1.5h)
  • C. Bougerol (Néel Institute, Grenoble, France): Structural characterization II (1.5h)
  • J. Christen (Magdeburg, Germany) : Cathodoluminescence (1.5h)
  • Rob Martin (Strathclyde, UK) : Multimode SEM techniques (1.5h)
Electronics (4.5h)
  • Y. Cordier (CRHEA, France): Compounds, transport (1.5h)
  • M. Uren (Bristol, UK) : Electronic characterization (1.5h)
  • J.C. De Jaeger (IEMN, Lille, France) : Micro-wave power components and circuits (1.5h)
Optics (4.5h)
  • B. Gil (L2C, Montpellier, France) and B. Gayral (INAC, Grenoble, France): Optical properties (3h)
  • R. Taylor (Oxford, UK) : Nanophotonics (1.5h)
Devices (2h)
  • B. Corbett (Tyndall, Ireland) : Devices, fabrication (2h)
Modelisation (3h)
  • Matthias auf der Maur (Roma, Italy) (3h)

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