Lectures (in english):

C. Brylinski (LMI, Lyon, France): Power electronics (3,4 Mo)
C. Bougerol (Néel Institute, Grenoble, France): Structural characterization II (6,43 Mo)
S. Delage (III-V Lab, Palaiseau, France): Microwave devices (16 Mo)
G. Feuillet (CEA, Grenoble, France): GaN vs other materials (5,14 Mo)
B. Gayral (CEA, Grenoble, France): Optics II (4,79 Mo)
N. Grandjean (EPFL, Lausanne-Switzerland): Growth (21 Mo)
J.C. Harmand (LPN, Marcoussis, France): Nanowires (12,4 Mo)
M. Leroux (CRHEA, Valbonne, France): Optics I (3,96 Mo)
M. Nemoz (CRHEA, Valbonne, France): Structural characterization I (2,66 Mo)
R. Resta (Trieste University-Italy): Piezoelectricity (9,65 Mo)
M. Strassburg (OSRAM-Germany): Optical devices (10,7 Mo)
M. Stutzmann (WSI, Munich, Germany): Bio-sensors (5 Mo)
M.Tchernycheva (IEF, Orsay, France): Optics III (25,9 Mo)
D. Théron (IEMN, Lille, France): Nems/Mems (4,85 Mo)